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X-ray Scattering Study of Two Length Scales in the Critical Fluctuations of CuGeO3

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Title

X-ray Scattering Study of Two Length Scales in the Critical Fluctuations of CuGeO3

Author(s)

Wang, Y. J.
Kim, Y. J.
Christianson, Rebecca J.
LaMarra, S. C.
Chou, F. C.

Description

The critical fluctuations of CuGeO3 have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the a axis, with the a axis along the surface normal direction. We believe that such a directional preference is a clear sign that random surface strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.

Date Published

2018-03-26 15:06:57

Files

  • Download Christianson_CriticalFluctuations.pdf

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Olin College of Engineering

An undergraduate engineering institution exploring innovative approaches to engineering education since its founding in 1997.

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