X-ray Scattering Study of Two Length Scales in the Critical Fluctuations of CuGeO3
Wang, Y. J. Kim, Y. J. Christianson, Rebecca J. LaMarra, S. C. Chou, F. C.
The critical fluctuations of CuGeO3 have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the a axis, with the a axis along the surface normal direction. We believe that such a directional preference is a clear sign that random surface strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.