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Micron Scale Toner Particle Characterization (Lexmark)

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In SCOPE Projects

Title

Micron Scale Toner Particle Characterization (Lexmark)

Author(s)

Stark, Meryl
Lloyd, Ashley
Towers, Emily

Description

The team researched the effectiveness and viability of using colloid probe atomic force microscopy (AFM) as a method for characterizing relevant toner properties on a microscale.

Date Published

2018-03-26 15:14:42

Files

  • Download Lexmark_Display_Poster.pdf

Rights Statements

In Copyright - Educational Use Permitted

Linked Data for this Object

Wikidata subjects
toner Microscale

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Olin College of Engineering

An undergraduate engineering institution exploring innovative approaches to engineering education since its founding in 1997.

1000 Olin Way
Needham, MA 02492
781.292.2390