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Measurement of Metal Migration on Thick Film Piezoresistors and Their Termination

Author(s)

Kerns, David V.
Song, C
Davidson, J. L.

Description

Metal migration from the thick-film termination can affect not only the electrical characteristics but also the gauge factor or piezoresistive coefficient of thick-film sensors. Four sets of sensors w...

Type of Resource

Conference

Rights Statements

In Copyright - Educational Use Permitted