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Single-Event Charge Enhancement in SOI Devices

Author(s)

Kerns, David V.
Kerns, Sherra E.
Massengill, L W

Description

Studies are presented of single-particle ion effects in body-tied CMOS/silicon-on-insulator (SOI) devices. It is shown that two mechanisms can contribute to SOI soft-error rates: a direct ion-induced ...

Type of Resource

Article

Rights Statements

In Copyright - Educational Use Permitted